Bob Waugh (Allen Robert Waugh) worked for many years on the development and application of the field ion microscope and the associated techniques of the imaging atom probe and time-of-flight mass spectroscopy.
These are some of the slides from his collection marked "B" on the original. Comparative performance of SIMS analysers. "SIMS" stands for secondary ion mass spectrometer.
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Bob Waugh's full archive | PT Group Home | Materials Algorithms |